IWATSU ON PROBE SS-350 dynamic resistor (Rds ON voltage) test solution

current collapse remains one of the biggest concerns for many engineers about GaN power transistors, making evaluation very challenging due to instrument limitations.

engineers can conveniently create a repeatable and reliable dual-pulse evaluation system using the IWATSU SS-350 probe

can reliably measure the dynamic on-voltage drop (also known as dynamic Rds on) of wide bandgap devices. This solution is currently the optimal global solution for evaluating dynamic on-resistance.

Reliably measures the dynamic conduction voltage drop (also known as dynamic Rds on) of wide bandgap devices. The SS-350 is a professional probe that can

measure switch-to-switch voltage (ON voltage) when switching devices like MOSFETs are turned on By limiting (clamping) the high voltage generated when the switching device turns off, it can measure low conduction voltage more accurately.

Main features:

• Maximum input voltage 2,000Vpeak

• clamping voltage 1.5V/2.5V/5.5V

• IWATSU The DS-8000 series can be used to set clamping voltage, offset voltage, and

power supply *This product is only compatible with IWATSU DS-8000 series oscilloscopes

Best application:

• Temperature Dependence Assessment

• of On-Resistance of SiC Devices Assessment

• of the Increasing On-Resistance of GaN Device Current Failures Detecting the Impact

• of Abnormal Temperature Rise in Conduction Voltage Measuring the Increase in On-Voltage Caused by Overcurrent State