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PMK FireFly®FF-1500A optically isolated probe 1.3 GHz/1.5 GHz high CMRR (180 dB) high-voltage 2500 V double-pulse VGS gate /VDS drain voltage
PMK FireFly®FF-1500A optically isolated probe 1.3 GHz/1.5 GHz high CMRR (180 dB) high-voltage 2500 V double-pulse VGS gate /VDS drain voltageBrand: PMK
Origin: Germany
FireFly® high-voltage optically isolated probe solution high-common-mode voltage precision high-bandwidth differential, bandwidth with high- common-mode rejection. >1.5 GHz input, up to >180 dB …
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IWATSU multi-channel high-voltage high-frequency optically isolated measurement probe Isolation SE-6000 remote UHV safety test system
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CIC high-voltage differential probe DP20-20K-LVC high-precision 0.1% high-frequency isolated high CMRR 20 kV
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PEM CWT Ultra mini ultra-mini Rogowski coil UM150 pulse current probe 30KA (1.7 mm conductor diameter) for wide-bandgap semiconductor device test
PEM CWT Ultra mini ultra-mini Rogowski coil UM150 pulse current probe 30KA (1.7 mm conductor diameter) for wide-bandgap semiconductor device testBrand: PEM
Origin: UK
CWT Ultra mini UM)Rogowski coil max. cross-section diameter 1 7 mm, semiconductor. bandwidth up to 30 MHz (-3dB) and temperature range high-frequency performance CWT Mini measurement power electronics…
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IWATSU SS-289A-H high-temperature-40 to 150 deg 12000 A high-frequency Rogowski current coil probe 1.7 mm for SiC device GaN test
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IWATSU SS-531 Hall-effect current probe AC/DC high-frequency clamp rated 30 A/5 A/0.5 A bandwidth 120 MHz
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Catalog
CategoriesBrandCategory
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Voltage Probe
Optically Isolated Voltage Probe
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High-Voltage Differential Probe
Optical Sensor
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Optically Isolated Current Probe
Probe Calibration System
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Integrated Test System
High-Frequency Rogowski Current Probe
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High-Frequency Non-Inductive Shunt
Fixtures & Accessories
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SiC Dynamic Parameter Test System
Lightning Current Waveform Acquisition System
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Manual
Manuals & DatasheetsBrandCategory
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Voltage Probe
Optically Isolated Voltage Probe
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High-Impedance Voltage Probe
High-Voltage Differential Probe
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Optical Sensor
Probe Calibration System
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Integrated Test System
High-Frequency Rogowski Current Probe
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High-Frequency Non-Inductive Shunt
Fixtures & Accessories
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SiC Dynamic Parameter Test System
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Test Reports
Professional Testing -
Solution
Years of Industry ExperienceBrandCategory
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Voltage Probe
Optically Isolated Voltage Probe
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High-Voltage Differential Probe
Optically Isolated Current Probe
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Probe Calibration System
Integrated Test System
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High-Frequency Rogowski Current Probe
High-Frequency Non-Inductive Shunt
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Fixtures & Accessories
SiC Dynamic Parameter Test System
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Lightning Current Waveform Acquisition System
13.56 MHz High-Frequency UHV Waveform Acquisition
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Offshore Wind Power Remote Signal Acquisition System
Semiconductor Junction Temperature Measurement System
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