-
Cybertek HCP8300A(300 A/8 MHz) integrated open-loop clamp AC/DC high-frequency AC/DC current probe
-
Cybertek HCP8150A (150 A/22 MHz) integrated clamp-on AC/DC high-frequency Hall-effect current probe
-
Cybertek HCP8030H (30 A/70 MHz) high-frequency AC/DC Hall-effect current probe open-loop clamp integrated
-
Cybertek HCP8030C (30 A/70 MHz) high-frequency AC/DC Hall-effect current probe open-loop clamp integrated
-
IWATSU SS-288A-H high-temperature-40 to 150 deg 6000 A high-frequency Rogowski current coil probe 1.7 mm for SiC device GaN test
-
IWATSU SS-287A-H high-temperature-40 to 150 deg 3000 A high-frequency Rogowski current coil probe 1.7 mm for SiC device GaN test
-
IWATSU SS-286A-H high-temperature-40 to 150 deg 1200 A high-frequency Rogowski current coil probe 1.7 mm for SiC device GaN test
-
IWATSU SS-285A-H high-temperature-40 to 150 deg 600 A high-frequency Rogowski current coil probe 1.7 mm for SiC device GaN test
-
IWATSU SS-284A-H high-temperature-40 to 150 deg 300 A high-frequency Rogowski current coil probe 1.7 mm for SiC device GaN test
-
IWATSU SS-281A-H/SS-282A-H high-temperature-40 to 150 deg 30 A/60 A high-frequency Rogowski current coil probe 1.7 mm for SiC device GaN test
-
IWATSU SS-297/SS-298/SS-299 Rogowski probe 8.5 mm coil high-frequency pulse current transformer 30KA/60KA high-current 120KA
-
IWATSU SS-295/SS-295 Rogowski probe 8.5 mm coil high-frequency pulse current transformer 6000 A high-current 12000 A


















More Brands