Isolated Current Probe High-Frequency Rogowski Current Probe-Products-Probemart

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Optically Isolated Current Probe High-Frequency Rogowski Current Probe High-Frequency Current Transformer (CT) High-Frequency Hall Current Probe Fluxgate Current Probe TMR Current Sensor Low-Frequency AC/DC Probe Low-Frequency Rogowski Coil AC Probe Common-Mode Current Rogowski Coil

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PEM CWT Ultra mini ultra-mini Rogowski coil UM150 pulse current probe 30KA (1.7 mm conductor diameter) for wide-bandgap semiconductor device test PEM CWT Ultra mini ultra-mini Rogowski coil UM150 pulse current probe 30KA (1.7 mm conductor diameter) for wide-bandgap semiconductor device test Brand: PEM Origin: UK CWT Ultra mini UM)Rogowski coil max. cross-section diameter 1 7 mm, semiconductor. bandwidth up to 30 MHz (-3d… Brochure Manual Details
IWATSU SS-289A-H high-temperature-40 to 150 deg 12000 A high-frequency Rogowski current coil probe 1.7 mm for SiC device GaN test IWATSU SS-289A-H high-temperature-40 to 150 deg 12000 A high-frequency Rogowski current coil probe 1.7 mm for SiC device GaN test Brand: IWATSU Origin: Japan Isolated Current Probe. Detailed specifications are available in the product datasheet. Brochure Manual Details
PEM Rogowski coil CWT Mini50HF150 high-frequency 50 MHz flexible current probe 30KA PEM Rogowski coil CWT Mini50HF150 high-frequency 50 MHz flexible current probe 30KA Brand: PEM Origin: UK CWT Mini50HF device (SiC), with 50 MHz high-frequency (-3dB) bandwidth (100 mm coil) and 36 MHz (200 optional,… Brochure Manual Details
PEM Rogowski coil CWT Mini50HF30 high-frequency 50 MHz flexible current probe 6000 A PEM Rogowski coil CWT Mini50HF30 high-frequency 50 MHz flexible current probe 6000 A Brand: PEM Origin: UK CWT Mini50HF device (SiC), with 50 MHz high-frequency (-3dB) bandwidth (100 mm coil) and 36 MHz (200 optional,… Brochure Manual Details
PEM Rogowski coil CWT Mini50HF15 high-frequency 50 MHz flexible current probe 3000 A PEM Rogowski coil CWT Mini50HF15 high-frequency 50 MHz flexible current probe 3000 A Brand: PEM Origin: UK CWT Mini50HF device (SiC), with 50 MHz high-frequency (-3dB) bandwidth (100 mm coil) and 36 MHz (200 optional,… Brochure Manual Details
PEM Rogowski coil CWT Mini50HF6 high-frequency 50 MHz flexible current probe 1200 A PEM Rogowski coil CWT Mini50HF6 high-frequency 50 MHz flexible current probe 1200 A Brand: PEM Origin: UK CWT Mini50HF device (SiC), with 50 MHz high-frequency (-3dB) bandwidth (100 mm coil) and 36 MHz (200 optional,… Brochure Manual Details
PEM Rogowski coil CWT Mini06 mini series current transformer pulse probe 120 A (conductor diameter 3.5 mm) PEM Rogowski coil CWT Mini06 mini series current transformer pulse probe 120 A (conductor diameter 3.5 mm) Brand: PEM Origin: UK Mini coil series, up to 10 MHz, conductor diameter 3.5 mm, withstand voltage 2 kV/5 kV optional Brochure Manual Details
IWATSU SS-280A/SS-280A-H series high-frequency Rogowski current coil probe 1.7 mm for SiC device GaN test A-H high-temperature 150 °C IWATSU SS-280A/SS-280A-H series high-frequency Rogowski current coil probe 1.7 mm for SiC device GaN test A-H high-temperature 150 °C Brand: IWATSU Origin: Japan Isolated Current Probe. Detailed specifications are available in the product datasheet. Brochure Manual Details
IWATSU SS-620 series Rogowski probe 3 mm high-frequency coil suitable for SiC module measurement IWATSU SS-620 series Rogowski probe 3 mm high-frequency coil suitable for SiC module measurement Brand: IWATSU Origin: Japan IWATSU SS-620 series clamp-on flexible coil, for measurement, 3 mm conductor diameter, 25 MHz. high-frequency … Brochure Manual Details
PEM CWT Ultra mini ultra-mini Rogowski coil UM015 pulse current probe 30 A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test PEM CWT Ultra mini ultra-mini Rogowski coil UM015 pulse current probe 30 A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test Brand: PEM Origin: UK CWT Ultra mini UM)Rogowski coil max. cross-section diameter 1 7 mm, semiconductor. bandwidth up to 30 MHz (-3d… Brochure Manual Details
PEM CWT Ultra mini ultra-mini Rogowski coil UM series pulse current probe 30 A-6000A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test PEM CWT Ultra mini ultra-mini Rogowski coil UM series pulse current probe 30 A-6000A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test Brand: PEM Origin: UK CWT Ultra mini UM)Rogowski coil max. cross-section diameter 1 7 mm, semiconductor. bandwidth up to 30 MHz (-3d… Brochure Manual Details
IWATSU SS-280A-H high-temperature-40 to 150 deg 30000 A high-current high-frequency Rogowski current coil probe IWATSU SS-280A-H high-temperature-40 to 150 deg 30000 A high-current high-frequency Rogowski current coil probe Brand: IWATSU Origin: Japan Isolated Current Probe. Detailed specifications are available in the product datasheet. Brochure Manual Details

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