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Probemart.com | Probes, current sensors & calibration sources for pulsed-power testing

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PMK high-frequency Low-Z voltage probe PML 791 series general-purpose oscilloscope 1.5 GHz/30 V/5KΩ

PMK high-frequency Low-Z voltage probe PML 791 series general-purpose oscilloscope 1.5 GHz/30 V/5KΩ

PMK high-frequency Low-Z voltage probe PML 791 series general-purpose oscilloscope 1.5 GHz/30 V/5KΩ

Brand: PMK

Origin: Germany

PMK high-frequency Low-Z voltage probe PML 791 series, bandwidth 1.5 GHz, max input 30 V, ratio 100:1, impedan…

PMK high-frequency high- voltage probe TETRIS®1500 high-bandwidth 1.5Ghz Tektronix TAP1500

PMK high-frequency high- voltage probe TETRIS®1500 high-bandwidth 1.5Ghz Tektronix TAP1500

PMK high-frequency high- voltage probe TETRIS®1500 high-bandwidth 1.5Ghz Tektronix TAP1500

Brand: PMK

Origin: Germany

■ Up to 1.5GHz Bandwidth ■ ±8V Dynamic Input Range ■ 20V Maximum Input Voltage ■ 1MΩ / 0.9pF Input Impedanc…

PMK high-frequency Low-Z voltage probe PML 751 series general-purpose oscilloscope 1.5 GHz/12 V/500 Ω

PMK high-frequency Low-Z voltage probe PML 751 series general-purpose oscilloscope 1.5 GHz/12 V/500 Ω

PMK high-frequency Low-Z voltage probe PML 751 series general-purpose oscilloscope 1.5 GHz/12 V/500 Ω

Brand: PMK

Origin: Germany

PMK high-frequency Low-Z voltage probe PML 751 series, bandwidth 1.5 GHz, max input 12 V, ratio 10:1, impedanc…

IWATSU IE-1360 DE-SKEW CALIBRATOR voltage / current probe calibration

IWATSU IE-1360 DE-SKEW CALIBRATOR voltage / current probe calibration

IWATSU IE-1360 DE-SKEW CALIBRATOR voltage / current probe calibration

Brand: IWATSU

Origin: Japan

IWATSU DE-SKEW CALIBRATOR power semiconductor / high-range high-, voltage and current dedicated calibration sy…

PMK BumbleBee 400 MHz/500 MHz high-voltage differential probe 180 dB high-precision 2000 Vrms/6 kVpk double-pulse dynamic test VGS/VDS voltage

PMK BumbleBee 400 MHz/500 MHz high-voltage differential probe 180 dB high-precision 2000 Vrms/6 kVpk double-pulse dynamic test VGS/VDS voltage

PMK BumbleBee 400 MHz/500 MHz high-voltage differential probe 180 dB high-precision 2000 Vrms/6 kVpk double-pulse dynamic test VGS/VDS voltage

Brand: PMK

Origin: Germany

Isolated Voltage Probe. Detailed specifications are available in the product datasheet.

PMK high-frequency passive high-voltage probe PHV2000-RO (4 kV/400M) peak voltage 4000 V

PMK high-frequency passive high-voltage probe PHV2000-RO (4 kV/400M) peak voltage 4000 V

PMK high-frequency passive high-voltage probe PHV2000-RO (4 kV/400M) peak voltage 4000 V

Brand: PMK

Origin: Germany

PHV2000 series passive high-voltage probe PHV1000 upgrade, up to 400 MHz bandwidth, peak voltage 4000 V, 100:1…

PEM CWT Ultra mini ultra-mini Rogowski coil UM015 pulse current probe 30 A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test

PEM CWT Ultra mini ultra-mini Rogowski coil UM015 pulse current probe 30 A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test

PEM CWT Ultra mini ultra-mini Rogowski coil UM015 pulse current probe 30 A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test

Brand: PEM

Origin: UK

CWT Ultra mini UM)Rogowski coil max. cross-section diameter 1 7 mm, semiconductor. bandwidth up to 30 MHz (-3d…

T&M A series precision non-inductive coaxial resistor (4/5/6 Watt) medium-power shunt current probe

T&M A series precision non-inductive coaxial resistor (4/5/6 Watt) medium-power shunt current probe

T&M A series precision non-inductive coaxial resistor (4/5/6 Watt) medium-power shunt current probe

Brand: T&M Research

Origin: USA

POWERTEK T&M precision coaxial resistor, 4W/5 W/6 W

PEM CWT Ultra mini ultra-mini Rogowski coil UM series pulse current probe 30 A-6000A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test

PEM CWT Ultra mini ultra-mini Rogowski coil UM series pulse current probe 30 A-6000A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test

PEM CWT Ultra mini ultra-mini Rogowski coil UM series pulse current probe 30 A-6000A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test

Brand: PEM

Origin: UK

CWT Ultra mini UM)Rogowski coil max. cross-section diameter 1 7 mm, semiconductor. bandwidth up to 30 MHz (-3d…

PEM CWT LF low-frequency Rogowski coil current transformer (60 A-300kA)

PEM CWT LF low-frequency Rogowski coil current transformer (60 A-300kA)

PEM CWT LF low-frequency Rogowski coil current transformer (60 A-300kA)

Brand: PEM

Origin: UK

Isolated Current Probe. Detailed specifications are available in the product datasheet.

IWATSU SS-280A-H high-temperature-40 to 150 deg 30000 A high-current high-frequency Rogowski current coil probe

IWATSU SS-280A-H high-temperature-40 to 150 deg 30000 A high-current high-frequency Rogowski current coil probe

IWATSU SS-280A-H high-temperature-40 to 150 deg 30000 A high-current high-frequency Rogowski current coil probe

Brand: IWATSU

Origin: Japan

Isolated Current Probe. Detailed specifications are available in the product datasheet.

IWATSU SS-500 series Hall-effect current probe AC/DC high-frequency clamp-on clamp min. measurable milliamp level

IWATSU SS-500 series Hall-effect current probe AC/DC high-frequency clamp-on clamp min. measurable milliamp level

IWATSU SS-500 series Hall-effect current probe AC/DC high-frequency clamp-on clamp min. measurable milliamp level

Brand: IWATSU

Origin: Japan

SS-500 Hall-effect AC/DC probe, current 0.5 A-700A, bandwidth 2-120MHz, measurement AC and DC clamp-on

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