New Products

Infinity Sensor: High-Bandwidth Current Measurement for SiC and GaN Devices

High-bandwidth measurement With switching frequencies of MHz and edges lasting less than 10 ns, GHz bandwidths are required to visualise some of the important effects occurring in SiC and GaN converters. Whilst multi-GHz probes exist, they cannot typically be used in this application

Danisense MK500ID High-Precision AC/DC Fluxgate Clamp

APEC 2026, San Antonio, Texas: Danisense, the leader in high-precision current sensing, introduces the MK500ID for demanding applications - its first high-precision DC and AC current clamp designed for electrically isolated measurement up to 500 A. Standout specifications include industry-leading 0.05-degree phase error below 100 Hz - about twice the accuracy of comparable products - plus a high-frequency bandwidth raised to 1 MHz.

Jectronic PD-200X Double-Pulse Test Platform and Its Three Key Features

The Jectronic PD-200X double-pulse dynamic test platform: cost-effective, stable and universal, with modular intelligent design, excellent instrument and probe compatibility, and high-redundancy safety for high-voltage, high-current device testing. It is the most cost-effective double-pulse system available - ideal for universities, research institutes and semiconductor start-ups.

PEM Rogowski Coil Series: Product Update

PEM Rogowski coil update: the CWT miniHF series is discontinued; the new CWT-HF and CWTUM-S series take its place.

PEM CWTUM-F Split-Core Rogowski Coil

New from PEM: the CWTUM-F split Rogowski coil.

IWATSU and CRRC Zhuzhou: Latest Measurement Technology Seminar

IWATSU held a seminar in Zhuzhou on new SiC/GaN dynamic-parameter measurement techniques, attended by engineers from CRRC Zhuzhou Institute, CRRC Zhuzhou Times Electric and CRRC Times Semiconductor.

GaN Dynamic On-Resistance (RDS(on)) Testing: the IWATSU ON Probe SS-350

Current collapse remains one of the biggest concerns for GaN power transistors, and instrument limitations make it hard to evaluate. With the IWATSU SS-350 probe you can build a repeatable, reliable double-pulse bench that measures the dynamic on-voltage (dynamic RDS(on)) of wide-bandgap devices - the best solution available worldwide today.

PMK PHVX High-Voltage Probes up to 4 kV: Measuring VDS on the Low-Side Device

PMK FireFly FF-1500A Optically Isolated Voltage Probe for SiC/GaN VGS Double-Pulse Testing

As wide-bandgap measurement needs grow, high-bandwidth, high-voltage probes are the trend - hence the optically isolated probe.

IWATSU OPECS Optically Isolated Current Probe

A new answer for current measurement!