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Vamtek semiconductor parameters analyzer fixture CX&KX series power device TO-263 package for IWATSU CS-3000/5000 adapter
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Vamtek semiconductor parameters analyzer fixture CX&KX series power device TO-247-4 package for IWATSU CS-3000/5000 adapter
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Vamtek semiconductor parameters analyzer fixture CX&KX series power device TO-247-3 package for IWATSU CS for
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IWATSU adapter and CS-500 static dedicated measurement power device analyzer test socket fixture
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Keysight B1506A dedicated measurement power device analyzer test socket semiconductor static fixture
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High-performance type power device test socket for TO-247-3 and TO-220 3 package T3P-HH-KL-250 (high-temperature 250 °C)
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High-performance type power for 3 package / DC50A at 25°C PCB / T3P-HH-KL-220-FL
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High-performance type power for TO-247 4L package / DC50A at 25°C PCB T4P-HH-KL-220-FL
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JC power device test socket GD18-TO263-7-K-109 semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for TO-263-7 package
JC power device test socket GD18-TO263-7-K-109 semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for TO-263-7 packageBrand: JC Electronics
Origin: Japan
Power device test:SiC/GaN high-low-temperature, high-, high-voltage, high-current, low inductance. provides an…
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For TOLL type GaN device test socket semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation JC GD17-TOLL-K-FL
For TOLL type GaN device test socket semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation JC GD17-TOLL-K-FLBrand: JC Electronics
Origin: Japan
Power device test:SiC/GaN high-low-temperature, high-, high-voltage, high-current, low inductance. provides an…
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JC power device test socket GD18-TO263-K-109 semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for TO-263-3 and D2PAK package
JC power device test socket GD18-TO263-K-109 semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for TO-263-3 and D2PAK packageBrand: JC Electronics
Origin: Japan
Power device test:SiC/GaN high-low-temperature, high-, high-voltage, high-current, low inductance. provides an…
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JC power device test socket T3P-L214-ST-BK semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for TO-247-3 and TO-220 package
JC power device test socket T3P-L214-ST-BK semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for TO-247-3 and TO-220 packageBrand: JC Electronics
Origin: Japan
Fixtures & Accessories. Detailed specifications are available in the product datasheet.


















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