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IWATSU SS-664 ultra-fine 1 mm, SS-664P conductor diameter 1.2 mm high-frequency Rogowski current probe SiC device test TO-247-4 for IWATSU SS-664 ultra-fine 1 mm, SS-664P conductor diameter 1.2 mm high-frequency Rogowski current probe SiC device test TO-247-4 for Brand: IWATSU Origin: Japan SS-660 (P) series conductor diameter Rogowski coil 1/1.2 mm, clamp-on for GaN device current measurement, with… Brochure Manual Details
IWATSU SS-663 ultra-fine 1 mm, SS-663P conductor diameter 1.2 mm high-frequency Rogowski current probe SiC device test TO-247-4 for IWATSU SS-663 ultra-fine 1 mm, SS-663P conductor diameter 1.2 mm high-frequency Rogowski current probe SiC device test TO-247-4 for Brand: IWATSU Origin: Japan SS-660 (P) series conductor diameter Rogowski coil 1/1.2 mm, clamp-on for GaN device current measurement, with… Brochure Manual Details
IWATSU SS-662 ultra-fine 1 mm, SS-662P conductor diameter 1.2 mm high-frequency Rogowski current probe SiC device test TO-247-4 for IWATSU SS-662 ultra-fine 1 mm, SS-662P conductor diameter 1.2 mm high-frequency Rogowski current probe SiC device test TO-247-4 for Brand: IWATSU Origin: Japan SS-660 (P) series conductor diameter Rogowski coil 1/1.2 mm, clamp-on for GaN device current measurement, with… Brochure Manual Details
IWATSU SS-630S/SS-630M Rogowski current probe 3 mm high-frequency 30000 A suitable for SiC module measurement IWATSU SS-630S/SS-630M Rogowski current probe 3 mm high-frequency 30000 A suitable for SiC module measurement Brand: IWATSU Origin: Japan IWATSU SS-630S/SS-630M clamp-on flexible coil, for measurement, 3 mm conductor diameter, 20/25 MHz. high-frequ… Brochure Manual Details
IWATSU SS-628S/SS-628M Rogowski current probe 3 mm high-frequency 6000 A suitable for SiC module measurement IWATSU SS-628S/SS-628M Rogowski current probe 3 mm high-frequency 6000 A suitable for SiC module measurement Brand: IWATSU Origin: Japan IWATSU SS-628S/SS-628M clamp-on flexible coil, for measurement, 3 mm conductor diameter, 20/25 MHz. high-frequ… Brochure Manual Details
IWATSU SS-627S/SS-627M Rogowski current probe 3 mm high-frequency 3000 A suitable for SiC module measurement IWATSU SS-627S/SS-627M Rogowski current probe 3 mm high-frequency 3000 A suitable for SiC module measurement Brand: IWATSU Origin: Japan IWATSU SS-627S/SS-627M clamp-on flexible coil, for measurement, 3 mm conductor diameter, 20/25 MHz. high-frequ… Brochure Manual Details
IWATSU SS-626S/SS-626M Rogowski current probe 3 mm high-frequency 1200 A suitable for SiC module measurement IWATSU SS-626S/SS-626M Rogowski current probe 3 mm high-frequency 1200 A suitable for SiC module measurement Brand: IWATSU Origin: Japan IWATSU SS-626S/SS-626M clamp-on flexible coil, for measurement, 3 mm conductor diameter, 20/25 MHz. high-frequ… Brochure Manual Details
IWATSU SS-625S/SS-625M Rogowski current probe 3 mm high-frequency 600 A suitable for SiC module measurement IWATSU SS-625S/SS-625M Rogowski current probe 3 mm high-frequency 600 A suitable for SiC module measurement Brand: IWATSU Origin: Japan IWATSU SS-625S/SS-625M clamp-on flexible coil, for measurement, 3 mm conductor diameter, 20/25 MHz. high-frequ… Brochure Manual Details
IWATSU SS-624S/SS-624M Rogowski current probe 3 mm high-frequency 300 A suitable for SiC module measurement IWATSU SS-624S/SS-624M Rogowski current probe 3 mm high-frequency 300 A suitable for SiC module measurement Brand: IWATSU Origin: Japan IWATSU SS-624S/SS-624M clamp-on flexible coil, for measurement, 3 mm conductor diameter, 20/25 MHz. high-frequ… Brochure Manual Details
IWATSU SS-623S/SS-623M Rogowski coil 3 mm high-frequency current probe 120 A suitable for SiC module measurement IWATSU SS-623S/SS-623M Rogowski coil 3 mm high-frequency current probe 120 A suitable for SiC module measurement Brand: IWATSU Origin: Japan IWATSU SS-623S/SS-623M clamp-on flexible coil, for measurement, 3 mm conductor diameter, 20/25 MHz. high-frequ… Brochure Manual Details
IWATSU SS-622S/SS-622M Rogowski current probe 3 mm high-frequency 60 A suitable for SiC module measurement IWATSU SS-622S/SS-622M Rogowski current probe 3 mm high-frequency 60 A suitable for SiC module measurement Brand: IWATSU Origin: Japan IWATSU SS-622S/SS-622M clamp-on flexible coil, for measurement, 3 mm conductor diameter, 20/25 MHz. high-frequ… Brochure Manual Details
IWATSU Rogowski coil SS-280A high-frequency 30M high-current 30000 A conductor diameter 1.7 mm for TO type MOSFET and IGBT IWATSU Rogowski coil SS-280A high-frequency 30M high-current 30000 A conductor diameter 1.7 mm for TO type MOSFET and IGBT Brand: IWATSU Origin: Japan 1.7 mm ultra-mini conductor diameter, 30000 A high-range, high-frequency bandwidth 30M Brochure Manual Details

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