SiC and IGBT Dynamic Double-Pulse Testing: Procedure and Pitfalls
Understand the key IGBT parameters - Eon, Eoff, Tdon, Tdoff, Tr, Tf and the switching characteristics - and verify datasheet values while comparing the performance of different modules.
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Choosing the Right Probe for Double-Pulse Testing
Double-pulse testing is a key method for evaluating the dynamic behavior of power semiconductors such as MOSFETs and IGBTs. A working double-pulse bench is the first step toward sound evaluation; besides the basics - test board, supplies, signal generator, inductor and oscilloscope - this article focuses on the probes, leaving you with a clear picture of probe selection.
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Selecting T&M Non-Inductive Coaxial Shunts for Double-Pulse Ids Measurement
A coaxial shunt is essentially a very small resistor that measures current by Ohm's law - typically for large pulsed currents. The right shunt depends on the measurement scenario; selection comes down to the factors below.
Views: 2083
Using the Offset Function on the PMK BumbleBee High-Voltage Differential Probe
Comparing the two measurements shows the benefit of the Bumblebee differential probe's offset feature. In real power-device work the switching voltages swing between 0 V and the bus voltage; leave margin for spike overshoot and the negative dynamic range of ordinary differential probes adds little value. The Bumblebee's offset converts the negative range into usable positive measuring range, so a smaller range - and better resolution - can be used while keeping adequate dynamic range.
Views: 1349
Voltage Measurement under High Common-Mode Interference: Optically Isolated Probes
New-energy growth has accelerated power-semiconductor development in PV, wind, EVs and transport: higher voltages, faster switching, lower losses - and ever trickier problems from the high-voltage, high-frequency environment. The complex electromagnetic fields around switching devices make common-mode interference an ever bigger issue in electronic measurement. How do you keep measurements accurate under high voltage and high frequency?
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Inside a Power-Device Double-Pulse Test Platform
With advanced power devices arriving and converter design becoming ever finer, both device engineers and power-supply engineers are paying more and more attention to double-pulse testing.
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Selecting a Power-Device Dynamic Parameter Test System: Avoiding the Pitfalls
Dynamic behavior is a defining property of power devices, playing a vital role in device development, system application and academic research - so dynamic-parameter testing, done mainly by double-pulse testing, is a mandatory step in all of this work.
Views: 129
PD-200X Cost-Effective Double-Pulse Test Platform and Its Three Key Features
The Jectronic PD-200X double-pulse dynamic test platform: cost-effective, stable and universal, with modular intelligent design, excellent instrument and probe compatibility, and high-redundancy safety for high-voltage, high-current device testing. It is the most cost-effective double-pulse system available - ideal for universities, research institutes and semiconductor start-ups.
Views: 840
IWATSU SS-660P: A High-Frequency Rogowski Probe for Direct Switching-Parameter Measurement on TO247-4
The distinctive feature of the TO-247-4 package is the fourth lead to the gate driver: it removes the influence of the emitter lead's high-frequency stray inductance in the gate loop, so the IGBT responds faster to the drive. The faster response of SiC IGBTs and MOSFETs cuts switching energy loss and allows faster turn-on and turn-off.
Views: 1106
Negative Current in GaN Double-Pulse Testing
GaN device: SYSTEM GS66508T evaluation: ACPL-P346 pulse: IWATSU IWASTU DG8000, 6 oscilloscope: DS-8108, 8 1G bandwidth, 12BIT resolution power supply: SPV600VDC4000W, DC600V, 4000 W high-voltage differential probe: PMK BUMBLEBEE, 2000 VRMS, 400M current T&M SDN-414-10, 0.1, 2G Rogowski coil SS-286, 30M 1200 A, issue: double-pulse medium-,, and
Views: 1461