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IWATSU SS-289A-H high-temperature-40 to 150 deg 12000 A high-frequency Rogowski current coil probe 1.7 mm for SiC device GaN test
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IWATSU SS-280A/SS-280A-H series high-frequency Rogowski current coil probe 1.7 mm for SiC device GaN test A-H high-temperature 150 °C
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IWATSU SS-620 series Rogowski probe 3 mm high-frequency coil suitable for SiC module measurement
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IWATSU SS-280A-H high-temperature-40 to 150 deg 30000 A high-current high-frequency Rogowski current coil probe
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IWATSU SS-283A-H high-temperature-40 to 150 deg 120 A high-frequency Rogowski current coil probe 1.7 mm for SiC device GaN test
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IWATSU SS-660/SS-660P series ultra-fine 1 mm/1.2 mm high-frequency Rogowski coil current test probe SiC device
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IWATSU Rogowski coil SS-286A high-frequency current probe 1200 A conductor diameter 1.7 mm for TO type MOSFET and IGBT
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IWATSU Rogowski coil SS-281A/SS-282A high-frequency current probe 1.7 mm for TO type MOSFET and IGBT
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IWATSU Rogowski coil SS-288A/SS-289A high-frequency current probe 6000 A/12000 A conductor diameter 1.7 mm for TO type MOSFET and IGBT
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IWATSU Rogowski coil SS-287A high-frequency current probe 3000 A conductor diameter 1.7 mm for TO type MOSFET and IGBT
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IWATSU Rogowski coil SS-284A high-frequency current probe 300 A conductor diameter 1.7 mm for TO type MOSFET and IGBT
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IWATSU Rogowski coil SS-283A/SS-285A high-frequency current probe 1.7 mm for TO type MOSFET and IGBT


















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