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IWATSU multi-channel high-voltage high-frequency optically isolated measurement probe Isolation SE-6000 remote UHV safety test system

IWATSU multi-channel high-voltage high-frequency optically isolated measurement probe Isolation SE-6000 remote UHV safety test system

IWATSU multi-channel high-voltage high-frequency optically isolated measurement probe Isolation SE-6000 remote UHV safety test system

Brand: IWATSU

Origin: Japan

Isolated Voltage Probe. Detailed specifications are available in the product datasheet.

IWATSU SS-289A-H high-temperature-40 to 150 deg 12000 A high-frequency Rogowski current coil probe 1.7 mm for SiC device GaN test

IWATSU SS-289A-H high-temperature-40 to 150 deg 12000 A high-frequency Rogowski current coil probe 1.7 mm for SiC device GaN test

IWATSU SS-289A-H high-temperature-40 to 150 deg 12000 A high-frequency Rogowski current coil probe 1.7 mm for SiC device GaN test

Brand: IWATSU

Origin: Japan

Isolated Current Probe. Detailed specifications are available in the product datasheet.

IWATSU SS-531 Hall-effect current probe AC/DC high-frequency clamp rated 30 A/5 A/0.5 A bandwidth 120 MHz

IWATSU SS-531 Hall-effect current probe AC/DC high-frequency clamp rated 30 A/5 A/0.5 A bandwidth 120 MHz

IWATSU SS-531 Hall-effect current probe AC/DC high-frequency clamp rated 30 A/5 A/0.5 A bandwidth 120 MHz

Brand: IWATSU

Origin: Japan

SS-531, rated current 30 A/5 A/0.5 A bandwidth 120 MHz, measurement AC and DC clamp-on

IWATSU ON PROBE SS-350 dynamic resistor (Rds ON voltage) test solution

IWATSU ON PROBE SS-350 dynamic resistor (Rds ON voltage) test solution

IWATSU ON PROBE SS-350 dynamic resistor (Rds ON voltage) test solution

Brand: IWATSU

Origin: Japan

Isolated Voltage Probe. Detailed specifications are available in the product datasheet.

IWATSU OpECS optically isolated current probe 150 MHz

IWATSU OpECS optically isolated current probe 150 MHz

IWATSU OpECS optically isolated current probe 150 MHz

Brand: IWATSU

Origin: Japan

Isolated Current Probe. Detailed specifications are available in the product datasheet.

IWATSU SS-280A/SS-280A-H series high-frequency Rogowski current coil probe 1.7 mm for SiC device GaN test A-H high-temperature 150 °C

IWATSU SS-280A/SS-280A-H series high-frequency Rogowski current coil probe 1.7 mm for SiC device GaN test A-H high-temperature 150 °C

IWATSU SS-280A/SS-280A-H series high-frequency Rogowski current coil probe 1.7 mm for SiC device GaN test A-H high-temperature 150 °C

Brand: IWATSU

Origin: Japan

Isolated Current Probe. Detailed specifications are available in the product datasheet.

IWATSU HV-P30A, HV-P60A UHV probe 50M high-frequency pulse voltage 40/80 kV

IWATSU HV-P30A, HV-P60A UHV probe 50M high-frequency pulse voltage 40/80 kV

IWATSU HV-P30A, HV-P60A UHV probe 50M high-frequency pulse voltage 40/80 kV

Brand: IWATSU

Origin: Japan

IWATSU HV-P30A UHV probe, 50M bandwidth, DC voltage 30 kV, pulse 40 HV-P60A 60 80

IWATSU SS-620 series Rogowski probe 3 mm high-frequency coil suitable for SiC module measurement

IWATSU SS-620 series Rogowski probe 3 mm high-frequency coil suitable for SiC module measurement

IWATSU SS-620 series Rogowski probe 3 mm high-frequency coil suitable for SiC module measurement

Brand: IWATSU

Origin: Japan

IWATSU SS-620 series clamp-on flexible coil, for measurement, 3 mm conductor diameter, 25 MHz. high-frequency …

IWATSU IE-1360 DE-SKEW CALIBRATOR voltage / current probe calibration

IWATSU IE-1360 DE-SKEW CALIBRATOR voltage / current probe calibration

IWATSU IE-1360 DE-SKEW CALIBRATOR voltage / current probe calibration

Brand: IWATSU

Origin: Japan

IWATSU DE-SKEW CALIBRATOR power semiconductor / high-range high-, voltage and current dedicated calibration sy…

IWATSU SS-280A-H high-temperature-40 to 150 deg 30000 A high-current high-frequency Rogowski current coil probe

IWATSU SS-280A-H high-temperature-40 to 150 deg 30000 A high-current high-frequency Rogowski current coil probe

IWATSU SS-280A-H high-temperature-40 to 150 deg 30000 A high-current high-frequency Rogowski current coil probe

Brand: IWATSU

Origin: Japan

Isolated Current Probe. Detailed specifications are available in the product datasheet.

IWATSU SS-500 series Hall-effect current probe AC/DC high-frequency clamp-on clamp min. measurable milliamp level

IWATSU SS-500 series Hall-effect current probe AC/DC high-frequency clamp-on clamp min. measurable milliamp level

IWATSU SS-500 series Hall-effect current probe AC/DC high-frequency clamp-on clamp min. measurable milliamp level

Brand: IWATSU

Origin: Japan

SS-500 Hall-effect AC/DC probe, current 0.5 A-700A, bandwidth 2-120MHz, measurement AC and DC clamp-on

IWATSU SS-283A-H high-temperature-40 to 150 deg 120 A high-frequency Rogowski current coil probe 1.7 mm for SiC device GaN test

IWATSU SS-283A-H high-temperature-40 to 150 deg 120 A high-frequency Rogowski current coil probe 1.7 mm for SiC device GaN test

IWATSU SS-283A-H high-temperature-40 to 150 deg 120 A high-frequency Rogowski current coil probe 1.7 mm for SiC device GaN test

Brand: IWATSU

Origin: China

Isolated Current Probe. Detailed specifications are available in the product datasheet.

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