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IWATSU multi-channel high-voltage high-frequency optically isolated measurement probe Isolation SE-6000 remote UHV safety test system
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IWATSU SS-289A-H high-temperature-40 to 150 deg 12000 A high-frequency Rogowski current coil probe 1.7 mm for SiC device GaN test
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IWATSU SS-531 Hall-effect current probe AC/DC high-frequency clamp rated 30 A/5 A/0.5 A bandwidth 120 MHz
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IWATSU ON PROBE SS-350 dynamic resistor (Rds ON voltage) test solution
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IWATSU OpECS optically isolated current probe 150 MHz
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IWATSU SS-280A/SS-280A-H series high-frequency Rogowski current coil probe 1.7 mm for SiC device GaN test A-H high-temperature 150 °C
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IWATSU HV-P30A, HV-P60A UHV probe 50M high-frequency pulse voltage 40/80 kV
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IWATSU SS-620 series Rogowski probe 3 mm high-frequency coil suitable for SiC module measurement
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IWATSU SS-500 series Hall-effect current probe AC/DC high-frequency clamp-on clamp min. measurable milliamp level
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IWATSU SS-283A-H high-temperature-40 to 150 deg 120 A high-frequency Rogowski current coil probe 1.7 mm for SiC device GaN test


















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